Thickness and Beyond. Exploiting Spectroscopic Ellipsometry and Atomic Force Nanolithography for the Investigation of Ultrathin Interfaces of Biologic Interest
Crossref DOI link: https://doi.org/10.1007/978-3-319-75895-4_4
Published Online: 2018-05-07
Published Print: 2018
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Parisse, Pietro
Solano, Ilaria
Magnozzi, Michele
Bisio, Francesco
Casalis, Loredana
Cavalleri, Ornella
Canepa, Maurizio
License valid from 2018-01-01
Text and Data Mining valid from 2018-01-01
Chapter History
First Online: 7 May 2018