Materials Characterization Using Scanning Tunneling Microscopy: From Fundamentals to Advanced Applications
Crossref DOI link: https://doi.org/10.1007/978-3-319-92955-2_6
Published Online: 2018-09-19
Published Print: 2018
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Debata, Suryakanti
Das, Trupti R.
Madhuri, Rashmi
Sharma, Prashant K.
Text and Data Mining valid from 2018-01-01