Combined Modeling and Experimental Approach to Improve Mechanical Impact Survivability of GaN Power FET
Crossref DOI link: https://doi.org/10.1007/978-3-319-95879-8_17
Published Online: 2018-09-19
Published Print: 2019
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ferguson, John B.
Sihn, Sangwook
Hilton, Albert M.
McKinion, Curtis M.
Dooley, Steven R.
Roy, Ajit K.
Schrand, Amanda M.
Heller, Eric R.
License valid from 2018-09-19