Observability-Aware Post-Silicon Test Generation
Crossref DOI link: https://doi.org/10.1007/978-3-319-98116-1_7
Published Online: 2018-09-02
Published Print: 2019
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Farahmandi, Farimah
Mishra, Prabhat
License valid from 2018-09-02