Comparison of Search-Based Algorithms for Stress-Testing Integrated Circuits
Crossref DOI link: https://doi.org/10.1007/978-3-319-99241-9_10
Published Online: 2018-08-22
Published Print: 2018
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Eljuse, Basil
Walkinshaw, Neil
License valid from 2018-01-01