Atomic Force Microscopy (AFM) for Topography and Recognition Imaging at Single-Molecule Level
Crossref DOI link: https://doi.org/10.1007/978-3-642-35943-9_496-1
Published Online: 2018-04-27
Published Print: 2018
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Duman, Memed
Oh, Yoo Jin
Zhu, Rong
Leitner, Michael
Ebner, Andreas
Hinterdorfer, Peter
License valid from 2018-01-01
Text and Data Mining valid from 2018-01-01
Chapter History
Received: 15 November 2017, 00:00:00
Accepted: 20 November 2017, 00:00:00
First Online: 27 April 2018