Variations in Device Characteristics
Crossref DOI link: https://doi.org/10.1007/978-4-431-56594-9_5
Published Online: 2018-07-21
Published Print: 2019
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Onodera, Hidetoshi
Miura, Yukiya
Sato, Yasuo
Kajihara, Seiji
Sato, Toshinori
Yano, Ken
Kunitake, Yuji
Nii, Koji
License valid from 2018-07-21