Online Test Microstructures of the Thermophysical Properties of MEMS Conducting Films
Crossref DOI link: https://doi.org/10.1007/978-981-10-5945-2_6
Published Online: 2018-04-20
Published Print: 2018
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Liu, Hai-Yun
Zhou, Zai-Fa
Huang, Qing-An
License valid from 2018-01-01