Pseudo-BIST: A Novel Technique for SAR-ADC Testing
Crossref DOI link: https://doi.org/10.1007/978-981-10-7470-7_18
Published Online: 2017-12-21
Published Print: 2017
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Gupta, Yatharth
Deb, Sujay
Singh, Vikrant
Srinivasan, V. N.
Sharma, Manish
Das, Sabyasachi
License valid from 2017-01-01