LISOCHIN: An NBTI Degradation Monitoring Sensor for Reliable CMOS Circuits
Crossref DOI link: https://doi.org/10.1007/978-981-10-7470-7_44
Published Online: 2017-12-21
Published Print: 2017
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Shah, Ambika Prasad
Yadav, Nandakishor
Vishvakarma, Santosh Kumar
License valid from 2017-01-01