Thermal Stability of Er2O3–Al2O3 Thin Films Grown on Si Substrates
Crossref DOI link: https://doi.org/10.1007/978-981-13-0110-0_41
Published Online: 2018-04-20
Published Print: 2018
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Pan, Xiaojie
Zhang, Zhifang
Zhu, Yanyan
Fang, Zebo
Cao, Haijing
License valid from 2018-01-01