A Correlated Study of Nanotube/Nanowire Transistor Between TEM Inspection and Electrical Characterization
Crossref DOI link: https://doi.org/10.1007/978-981-13-2367-6_2
Published Online: 2018-11-24
Published Print: 2019
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lan, Yann-Wen
Chen, Po-Chun
Text and Data Mining valid from 2018-11-24