A Novel Method to Detect Program Malfunctioning on Embedded Devices Using Run-Time Trace
Crossref DOI link: https://doi.org/10.1007/978-981-13-2553-3_47
Published Online: 2018-11-20
Published Print: 2019
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Singhal, Garima
Roy, Sahadev
Text and Data Mining valid from 2018-11-20