Analysis of Capacitance–Voltage Characteristics for Ultrathin Si/SiGe/Si Hetero-Layered MOS Structure
Crossref DOI link: https://doi.org/10.1007/978-981-15-0339-9_8
Published Online: 2019-10-31
Published Print: 2020
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Dhar, Rudra Sankar
Khiangte, Lalthanpuii
Sultana, Parvin
Kumar, Ankit
Text and Data Mining valid from 2019-10-31
Chapter History
First Online: 31 October 2019