Sensitivity Maps Preparation for Electrical Capacitance Tomography Using Finite Element Approach
Crossref DOI link: https://doi.org/10.1007/978-981-15-2317-5_7
Published Online: 2020-03-24
Published Print: 2020
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ropandi, Wan A. N.
Zulkiflli, N. A.
Pusppanathan, J.
Phang, F. A.
Nawi, N. D.
Johana, M. E.
Ngadiman, N. H. A.
Text and Data Mining valid from 2020-01-01
Version of Record valid from 2020-01-01
Chapter History
First Online: 24 March 2020