Refractive Index and Dielectric Constant Evaluation of RF Sputtered Few Layer MoS2 Thin Film
Crossref DOI link: https://doi.org/10.1007/978-981-32-9775-3_59
Published Online: 2019-12-04
Published Print: 2020
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Singh, Richa
Tripathi, Shweta
Text and Data Mining valid from 2019-12-04
Chapter History
First Online: 4 December 2019