Testing naturalness at 100 TeV
Crossref DOI link: https://doi.org/10.1007/JHEP09(2017)129
Published Online: 2017-09-26
Published Print: 2017-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Chen, Chuan-Ren
Hajer, Jan
Liu, Tao
Low, Ian
Zhang, Hao