Linear and quadratic in temperature resistivity from holography
Crossref DOI link: https://doi.org/10.1007/JHEP11(2016)128
Published Online: 2016-11-22
Published Print: 2016-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ge, Xian-Hui
Tian, Yu
Wu, Shang-Yu
Wu, Shao-Feng