Built-in Self Test Power and Test Time Analysis in On-chip Networks
Crossref DOI link: https://doi.org/10.1007/s00034-014-9892-4
Published Online: 2014-09-23
Published Print: 2015-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Senejani, Mahdieh Nadi
Ghadiry, Mahdiar
Ooi, Chia Yee
Marsono, Muhammad Nadzir
Text and Data Mining valid from 2014-09-23