Multiscale image quality measures for defect detection in thin films
Crossref DOI link: https://doi.org/10.1007/s00170-014-6758-7
Published Online: 2015-01-30
Published Print: 2015-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Tolba, A. S.
Raafat, Hazem M.
Text and Data Mining valid from 2015-01-30