A digital metrology process model (MPM) for measuring planning and data analysis and its application with a computer-aided system
Crossref DOI link: https://doi.org/10.1007/s00170-017-0294-1
Published Online: 2017-03-24
Published Print: 2017-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Chen, Zhehan
Funding for this research was provided by:
the Fundamental Research Funds for the Central Universities (FRF-TP-16-005A1)
License valid from 2017-03-24