Bayesian accelerated life testing under competing log-location-scale family of causes of failure
Crossref DOI link: https://doi.org/10.1007/s00180-015-0602-x
Published Online: 2015-07-21
Published Print: 2016-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Mukhopadhyay, Chiranjit
Roy, Soumya
Text and Data Mining valid from 2015-07-21