Three-stage confidence intervals for a linear combination of locations of two negative exponential distributions
Crossref DOI link: https://doi.org/10.1007/s00184-017-0635-y
Published Online: 2017-11-24
Published Print: 2018-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Isogai, Eiichi
Uno, Chikara
License valid from 2017-11-24