A micropixelated ion-imaging detector for mass resolution enhancement of a QMS instrument
Crossref DOI link: https://doi.org/10.1007/s00216-014-8158-0
Published Online: 2014-10-01
Published Print: 2015-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Syed, Sarfaraz U. A. H.
Eijkel, Gert B.
Maher, Simon
Kistemaker, Piet
Taylor, Stephen
Heeren, Ron M. A.
Text and Data Mining valid from 2014-10-01