Identification of microplastics by FTIR and Raman microscopy: a novel silicon filter substrate opens the important spectral range below 1300 cm−1 for FTIR transmission measurements
Crossref DOI link: https://doi.org/10.1007/s00216-015-8850-8
Published Online: 2015-06-28
Published Print: 2015-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Käppler, Andrea
Windrich, Frank
Löder, Martin G. J.
Malanin, Mikhail
Fischer, Dieter
Labrenz, Matthias
Eichhorn, Klaus-Jochen
Voit, Brigitte
Text and Data Mining valid from 2015-06-28