Specular X-ray reflectivity study of interfacial SiO2 layer in thermally annealed NiO/Si assembly
Crossref DOI link: https://doi.org/10.1007/s00339-014-8500-6
Published Online: 2014-05-28
Published Print: 2014-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Mitra, Subarna
Chakraborty, Suvankar
Menon, Krishnakumar S. R.
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