The evanescent-wave cavity ring-down spectroscopy technique applied to the investigation of thermally grown oxides on Si(100)
Crossref DOI link: https://doi.org/10.1007/s00339-014-8556-3
Published Online: 2014-06-24
Published Print: 2014-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Cotirlan-Simioniuc, C.
Ghita, R. V.
Negrila, C. C.
Logofatu, C.
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