A high-quality multilayer structure characterization method based on X-ray fluorescence and Monte Carlo simulation
Crossref DOI link: https://doi.org/10.1007/s00339-014-8838-9
Published Online: 2014-11-08
Published Print: 2015-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Brunetti, Antonio
Golosio, Bruno
Melis, Maria Grazia
Mura, Stefania
Text and Data Mining valid from 2014-11-08