Ultrahigh resolution characterizing nanoscale Seebeck coefficient via the heated, conductive AFM probe
Crossref DOI link: https://doi.org/10.1007/s00339-014-8891-4
Published Online: 2014-11-21
Published Print: 2015-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Xu, K. Q.
Zeng, H. R.
Yu, H. Z.
Zhao, K. Y.
Li, G. R.
Song, J. Q.
Shi, X.
Chen, L. D.
Text and Data Mining valid from 2014-11-21