Quality of Heusler single crystals examined by depth-dependent positron annihilation techniques
Crossref DOI link: https://doi.org/10.1007/s00339-015-9058-7
Published Online: 2015-02-27
Published Print: 2015-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Hugenschmidt, C.
Bauer, A.
Böni, P.
Ceeh, H.
Eijt, S. W. H.
Gigl, T.
Pfleiderer, C.
Piochacz, C.
Neubauer, A.
Reiner, M.
Schut, H.
Weber, J.
Text and Data Mining valid from 2015-02-27