Conduction behavior conversion for Cu-doped ZnS/n-type Si devices with different Cu contents
Crossref DOI link: https://doi.org/10.1007/s00339-015-9079-2
Published Online: 2015-03-01
Published Print: 2015-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ni, Wei-Shih
Lin, Yow-Jon
Text and Data Mining valid from 2015-03-01