Annealing effects on the electrical, structural and morphological properties of Ti/p-GaN/Ni/Au Schottky diode
Crossref DOI link: https://doi.org/10.1007/s00339-015-9396-5
Published Online: 2015-08-02
Published Print: 2015-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Nagaraju, G.
Rao, L. Dasaradha
Reddy, V. Rajagopal
Text and Data Mining valid from 2015-08-02