Analysis of interface states of FeO-Al2O3 spinel composite film/p-Si diode by conductance technique
Crossref DOI link: https://doi.org/10.1007/s00339-016-9782-7
Published Online: 2016-03-01
Published Print: 2016-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Tataroğlu, Adem
Al-Ghamdi, Ahmed A.
El-Tantawy, Farid
Farooq, W. A.
Yakuphanoğlu, F.
Text and Data Mining valid from 2016-03-01