A model for direct laser interference patterning of ZnO:Al - predicting possible sample topographies to optimize light trapping in thin-film silicon solar cells
Crossref DOI link: https://doi.org/10.1007/s00339-016-9974-1
Published Online: 2016-03-23
Published Print: 2016-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Dyck, Tobias http://orcid.org/0000-0001-7257-1433
Haas, Stefan
Funding for this research was provided by:
Ministerium für Wirtschaft, Energie, Industrie, Mittelstand und Handwerk des Landes Nordrhein-Westfalen (EN3003/B)
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