Impact of interface trap charges on dopingless tunnel FET for enhancement of linearity characteristics
Crossref DOI link: https://doi.org/10.1007/s00339-018-1923-8
Published Online: 2018-06-23
Published Print: 2018-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Chandan, Bandi Venkata
Nigam, Kaushal
Sharma, Dheeraj
Pandey, Sunil
Text and Data Mining valid from 2018-06-23
Article History
Received: 28 April 2018
Accepted: 14 June 2018
First Online: 23 June 2018