RF analysis and temperature characterization of pocket doped L-shaped gate tunnel FET
Crossref DOI link: https://doi.org/10.1007/s00339-019-3032-8
Published Online: 2019-09-28
Published Print: 2019-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Goswami, Partha Pratim
Khosla, Robin
Bhowmick, Brinda
Text and Data Mining valid from 2019-09-28
Version of Record valid from 2019-09-28
Article History
Received: 11 June 2019
Accepted: 22 September 2019
First Online: 28 September 2019