Determination of carrier lifetime in thermally evaporated In2S3 thin films by light induced transient grating technique
Crossref DOI link: https://doi.org/10.1007/s00339-020-03495-5
Published Online: 2020-04-01
Published Print: 2020-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Rasool, S.
Ščajev, P.
Saritha, K.
Svito, I.
Reddy, K. T. Ramakrishna
Tivanov, M. S.
Grivickas, V.
Text and Data Mining valid from 2020-04-01
Version of Record valid from 2020-04-01
Article History
Received: 29 November 2019
Accepted: 23 March 2020
First Online: 1 April 2020