Statistical and fractal analysis of nitrogen ion implanted tantalum thin films
Crossref DOI link: https://doi.org/10.1007/s00339-020-03671-7
Published Online: 2020-06-03
Published Print: 2020-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ramezani, A. H.
Hoseinzadeh, S. http://orcid.org/0000-0002-4282-074X
Ebrahiminejad, Zh.
Text and Data Mining valid from 2020-06-01
Version of Record valid from 2020-06-01
Article History
Received: 2 April 2020
Accepted: 26 May 2020
First Online: 3 June 2020