Investigation of V2O5/Ge8Sb92 multilayer thin film for high-data-retention and high-speed phase change memory applications
Crossref DOI link: https://doi.org/10.1007/s00339-020-03706-z
Published Online: 2020-06-15
Published Print: 2020-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Xu, Yongkang http://orcid.org/0000-0002-6691-9285
Hu, Yifeng
Sun, Song
Zhu, Xiaoqin
Lai, Tianshu
Funding for this research was provided by:
National Natural Science Foundation of China (11974008)
Text and Data Mining valid from 2020-06-15
Version of Record valid from 2020-06-15
Article History
Received: 28 February 2020
Accepted: 5 June 2020
First Online: 15 June 2020