Correlation between Kink effect and trapping mechanism through H1 hole trap in Al0.22Ga0.78N/GaN/SiC HEMTs by current DLTS: field effect enhancement
Crossref DOI link: https://doi.org/10.1007/s00339-020-03756-3
Published Online: 2020-06-29
Published Print: 2020-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Jabbari, I.
Baira, M.
Maaref, H.
Text and Data Mining valid from 2020-06-29
Version of Record valid from 2020-06-29
Article History
Received: 15 September 2019
Accepted: 23 June 2020
First Online: 29 June 2020