Impact of trap charge and temperature on DC and Analog/RF performances of hetero structure overlapped PNPN tunnel FET
Crossref DOI link: https://doi.org/10.1007/s00339-020-04054-8
Published Online: 2020-10-13
Published Print: 2020-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Baruah, Karabi http://orcid.org/0000-0002-1683-5876
Das, Rajashree
Baishya, Srimanta
Text and Data Mining valid from 2020-10-13
Version of Record valid from 2020-10-13
Article History
Received: 19 December 2019
Accepted: 4 October 2020
First Online: 13 October 2020