Combination of silicon phase masks with time-domain spectroscopy for single-scan terahertz imaging
Crossref DOI link: https://doi.org/10.1007/s00340-015-6153-6
Published Online: 2015-06-14
Published Print: 2015-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Jolly, A. http://orcid.org/0000-0003-4474-2279
Gokhan, F. S.
Jolly, J.-C.
Hocquet, S.
Chassagne, B.
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