Multiscale modelling framework for the fracture of thin brittle polycrystalline films: application to polysilicon
Crossref DOI link: https://doi.org/10.1007/s00466-014-1083-4
Published Online: 2014-10-21
Published Print: 2015-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Mulay, Shantanu S.
Becker, Gauthier
Vayrette, Renaud
Raskin, Jean-Pierre
Pardoen, Thomas
Galceran, Montserrat
Godet, Stéphane
Noels, Ludovic
Text and Data Mining valid from 2014-10-21