Effect of annealing temperatures on the morphology, optical and electrical properties of TiO2 thin films synthesized by the sol–gel method and deposited on Al/TiO2/SiO2/p-Si
Crossref DOI link: https://doi.org/10.1007/s00542-015-2514-7
Published Online: 2015-04-03
Published Print: 2016-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Muaz, A. K. M.
Hashim, U.
Ibrahim, Fatimah
Thong, K. L.
Mohktar, Mas S.
Liu, Wei-Wen
Text and Data Mining valid from 2015-04-03