Impact of stress effect on triple material gate step-FinFET with DC and AC analysis
Crossref DOI link: https://doi.org/10.1007/s00542-019-04727-2
Published Online: 2019-12-20
Published Print: 2020-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Das, Rinku Rani
Chowdhury, Atanu
Chakraborty, Apurba
Maity, Santanu http://orcid.org/0000-0001-6220-8163
Text and Data Mining valid from 2019-12-20
Version of Record valid from 2019-12-20
Article History
Received: 23 November 2019
Accepted: 13 December 2019
First Online: 20 December 2019