Investigation of electrical/analog performance and reliability of gate metal and source pocket engineered DG-TFET
Crossref DOI link: https://doi.org/10.1007/s00542-020-04845-2
Published Online: 2020-04-18
Published Print: 2021-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Madan, Jaya
Pandey, Rahul
Sharma, Rajnish
Chaujar, Rishu
Text and Data Mining valid from 2020-04-18
Version of Record valid from 2020-04-18
Article History
Received: 14 March 2019
Accepted: 7 April 2020
First Online: 18 April 2020