Effects of Spin-Dependent Recombination and EPR Spectroscopy of the Excited Triplet States of Point Defects in Silicon
Crossref DOI link: https://doi.org/10.1007/s00723-016-0799-z
Published Online: 2016-06-02
Published Print: 2016-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Vlasenko, L. S.
Funding for this research was provided by:
Government of Russia (14.Z50.31.0021)
Russian Foundation for Basic Research (15-02-06208)
License valid from 2016-06-02