ETV-ICP-OES: a useful technique for homogeneity study of trace element in metals—application to the homogeneity study of 23 elements in electrolytic copper
Crossref DOI link: https://doi.org/10.1007/s00769-017-1254-z
Published Online: 2017-03-06
Published Print: 2017-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Bacquart, Thomas
Hassler, Juergen
Vogt, Thomas
Perzl, Peter
Steigerwald, Sascha
Schmidt, Wieland
Sterckx, Marc
Linsinger, Thomas P. J.
License valid from 2017-03-06