(Re-)crystallization mechanism of highly oriented Si-microwire arrays by TEM analysis
Crossref DOI link: https://doi.org/10.1007/s10008-017-3672-6
Published Online: 2017-06-08
Published Print: 2017-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Neubüser, G. http://orcid.org/0000-0003-2314-7251
Hansen, S.
Duppel, V.
Adelung, R.
Kienle, L.
Funding for this research was provided by:
Deutsche Forschungsgemeinschaft (FO 183/20-2)
Text and Data Mining valid from 2017-06-08
Article History
Received: 30 January 2017
Revised: 31 May 2017
Accepted: 2 June 2017
First Online: 8 June 2017