Model-based test generation using extended symbolic grammars
Crossref DOI link: https://doi.org/10.1007/s10009-014-0316-3
Published Online: 2014-04-26
Published Print: 2014-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Guo, Hai-Feng
Subramaniam, Mahadevan
Text and Data Mining valid from 2014-04-26